Table 10‑1: Summary of possible radiation-induced background effects as a function of instrument technology (Part 2 of 3)	Comments	Discrete line emission
	Radiation sources	Protons & heavier nuclei Electrons Protons and neutrons Charged-particle induced X-ray emission (PIXE) Protons, heavier nuclei producing secondary electromagnetic cascades, and gammas from nuclear interactions Electron bremsstrahlung	Typically low-energy, high flux protons	Protons & heavier nuclei Electrons	Protons & heavier nuclei Electrons
	Effect	Direct ionisation Elastic & inelastic interactions Induced X-ray emission	Firsov scattering of protons off mirrors into detector	Direct ionisation	Particle tracks from direct ionisation and nuclear-interactions
	Example System	XMM, Chandra	XMM, Chandra	CREAM, SREM, CEASE
	Instrument / technology type		Grazing-incidence mirrors		Silicon CCD and APS, InSb, InGaAs, GaAs/GaAlAs, HgCdTe, PtSi
	Application	X-ray detection		Charged particle detectors	UV, optical and IR imaging detectors